Real-space characterization of tetragonal CuO epitaxial films

Zhong，Yong1; Dou，Ziyuan1; Wang，Rui Feng1; Lv，Yan Feng1; Han，Sha1; Yan，Hang1; Song，Can Li1,2; Ma，Xu Cun1,2; Xue，Qi Kun1,2,3,4

2021-10-25

10.1063/5.0069356

APPLIED PHYSICS LETTERS   影响因子和分区

0003-6951

1077-3118

It is widely believed that the undoped Mott insulator is crucial to understand the origin of high-TC superconductivity and the complex phase diagram in cuprates. Tetragonal CuO, the simplest structure among cuprates, is regarded as an archetypal model to explore the ground state physics of Mott insulator. Here, we report on the epitaxial growth and surface characterization of tetragonal CuO thin film by combining ozone-assisted molecular beam epitaxy and multi-analytical techniques. In situ scanning tunneling microscopy measurement reveals two sets of Cu2+ square lattices with a reversed contrast of their apparent heights between neighboring domains. A spectroscopy study demonstrates an upper bound of the charge transfer gap as 3.68 eV, and quantitatively agrees with the previous photoemission and x-ray photoelectron results. Our work will deepen the understanding of high-energy electronic structures in parent cuprates.

SCI ; EI

英语

NI期刊 ; NI论文

其他

Ministry of Science and Technology of China[2018YFA0305603] ; National Natural Science Foundation of China[51788104,11634007,62074092,11774192]

Physics

Physics, Applied

WOS:000730999400029

AIP Publishing

20214511112806

Charge transfer ; Copper oxides ; Electronic structure ; Ground state ; Molecular beam epitaxy ; Scanning tunneling microscopy

Electric Insulating Materials:413.1 ; Chemical Reactions:802.2 ; Inorganic Compounds:804.2 ; Atomic and Molecular Physics:931.3 ; Crystal Growth:933.1.2

PHYSICS

2-s2.0-85118460957

Scopus

1.State Key Laboratory of Low-Dimensional Quantum Physics,Department of Physics,Tsinghua University,Beijing,100084,China
2.Frontier Science Center for Quantum Information,Beijing,100084,China
3.Beijing Academy of Quantum Information Sciences,Beijing,100193,China
4.Southern University of Science and Technology,Shenzhen,518055,China

Zhong，Yong,Dou，Ziyuan,Wang，Rui Feng,et al. Real-space characterization of tetragonal CuO epitaxial films[J]. APPLIED PHYSICS LETTERS,2021,119(17).

Zhong，Yong.,Dou，Ziyuan.,Wang，Rui Feng.,Lv，Yan Feng.,Han，Sha.,...&Xue，Qi Kun.(2021).Real-space characterization of tetragonal CuO epitaxial films.APPLIED PHYSICS LETTERS,119(17).

Zhong，Yong,et al."Real-space characterization of tetragonal CuO epitaxial films".APPLIED PHYSICS LETTERS 119.17(2021).